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专利名称：METHOD AND A DEVICE FOR MEASURING A
FORCE AND A POSITION
发明人：Petr Gratz,Milos Hanus,Pavel Pangrac,Dieter
Bayer,Volker Ebert
申请号：US11467526申请日：20060825
公开号：US20070044567A1公开日：20070301
专利附图：
摘要：A method and apparatus for measuring a force and a position at a linearactuating mechanism (). In one illustrative embodiment, a change in an electrical
characteristic of a first coil system () for measuring a position of the linear actuatingmechanism, wherein the change in the electrical characteristic is caused by moving of afirst measurement member () in the first coil system (), and a change in an electricalcharacteristic of a second coil system () for measuring a force acting at the linearactuating mechanism (), wherein the change in the electrical characteristic is caused bymoving of a second measurement member () in the second coil system (), are detected.The movement of the first measurement member () is generated by a positional changeof a linear shaft member of the linear actuating mechanism (), and the movement of thesecond measurement member () is generated by a force-displacement conversion via adeformation member.
申请人：Petr Gratz,Milos Hanus,Pavel Pangrac,Dieter Bayer,Volker Ebert
地址：Kurim 634 CZ,Senohraby 25166 CZ,Senohraby 25166 CZ,Boblingen 71032DE,Leinfelden 70771 DE
国籍：CZ,CZ,CZ,DE,DE
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