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Punch through stopper for semiconductor device

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专利内容由知识产权出版社提供

专利名称:Punch through stopper for semiconductor

device

发明人:Effendi Leobandung,Tenko Yamashita申请号:US14962101申请日:20151208公开号:US09508833B1公开日:20161129

专利附图:

摘要:A method for forming a semiconductor device comprises, forming a fin on asemiconductor substrate, forming spacers adjacent to the fin, etching to remove exposedportions of the semiconductor substrate adjacent to the spacers to form a trench

adjacent to the spacers, removing the spacers, implanting dopants in the semiconductorsubstrate adjacent to the fin and in the trench, and performing an annealing process todiffuse the dopants in the semiconductor substrate and form a punch through stopperregion below the fin that includes the dopants.

申请人:International Business Machines Corporation

地址:Armonk NY US

国籍:US

代理机构:Cantor Colburn LLP

代理人:Vazken Alexanian

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