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专利名称：ANALYTICAL METHOD AND ANALYTICAL
SYSTEM
发明人：Hideki Nakanishi,Keisuke Utani,Kohei
Nishiguchi
申请号：US13057699申请日：20090722
公开号：US20110133074A1公开日：20110609
专利附图：
摘要：Analytical method and analytical system are presented, wherein properties ofthe carrier gas conveying fine particles and gas components generated by laser ablation
can be prevented from inhibiting the optimization of analysis conditions, and plural kindsof elements can be stably measured with high sensitivity and good accuracy withoutlosing operability, speed, and convenience when fine particles generated by laserablation are plasma-analyzed. A sample α is converted into fine particles by a laserablation device in the atmosphere of a first gas. The fine particles are conveyed from thelaser ablation device to a gas replacement device by using the first gas as a carrier gas.The first gas of at least part of the carrier gas conveying the fine particles is replacedwith a second gas by means of the gas replacement device. The fine particles are
conveyed from the gas replacement device to the plasma analyzer by the carrier gas thathas been subjected to the gas replacement. Constituent elements of the fine particlesare analyzed by the plasma analyzer.
申请人：Hideki Nakanishi,Keisuke Utani,Kohei Nishiguchi
地址：Hyogo JP,Hyogo JP,Hyogo JP
国籍：JP,JP,JP
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