专利内容由知识产权出版社提供
专利名称：Programmable logic device and method of
testing
发明人：Trent Whitten,Kam Fai So申请号：US11452714申请日：20060613公开号：US07463060B1公开日：20081209
专利附图：
摘要：A programmable logic device may comprise a plurality of programmableresources and non-volatile configuration memory to store configuration data by which toconfigure the programmable resources. Test override circuitry may determine a test
mode and selectively override the configuration data stored in the non-volatileconfiguration memory during the test mode for configuring the programmableresources based at least in part on test configuration data other than the configurationdata stored in the non-volatile memory. A buffer may be operable to drive aconfiguration select node for at least one of the programmable resources for
designating a configuration therefore based on the configuration data of the non-volatilememory. The test override circuitry may comprise a pull-down circuit operable, whenenabled dependent on the test configuration data, to drive the buffer with a high/lowlevel capable of overriding a state of the non-volatile configuration memory.
申请人：Trent Whitten,Kam Fai So
地址：Beaverton OR US,Beaverton OR US
国籍：US,US
更多信息请下载全文后查看
